The automatic detection of surface-level irregularities—defects or anomalies—in 3D data is of significant interest for various real-world purposes, such as industrial quality inspection, ...

Two questions asked in this paper were: is the measurement by 4D InSpec equivalent on the original surface in respect to a replica, that is, how similar are the results? And: under what circumstances ...

Following the basic finishing rules will help you avoid blisters and delaminations, dusting, crazing, crusting and reduced resistance to surface wear on interior, steel troweled floors. Building ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Processing diamond surfaces with femtosecond lasers yields a trade-off between hydrophilicity and low defect rate.

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...