Recent Progress in Direct X-Ray Detectors Based on Metal Oxide Wide Bandgap Semiconductors: A Review
Abstract: The direct conversion of X-ray irradiation using a semiconductor material is an emerging technology in medical diagnosis, material sciences, and industrial nondestructive testing. The wide ...
Abstract: Surface defects, including cracks, scratches, and deformations, significantly affect the product performance and service life in industrial manufacturing. Accurate detection of metal surface ...
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